Developments in integrated circuit testing /
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
London ; San Diego :
Academic Press,
c1987.
|
| Series: | Perspectives in computing (Boston, Mass.) ;
vol. 18. |
| Subjects: |
| Physical Description: | x, 440 p. : ill. ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references (p. [407]-431). |
| ISBN: | 0124967353 |