Pattern recognition and machine learning; proceedings.

Pattern recognition and machine learning; proceedings.

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Bibliographic Details
Corporate Author: Japan-U.S. Seminar on the Learning Process in Control Systems, Nagoya, Japan
Other Authors: Fu, K. S. (King Sun), 1930- (ed.)
Format: Conference Proceeding Book
Language:English
Published: New York, Plenum Press, 1971.
Subjects:
Pattern recognition systems.
Self-organizing systems > Congresses.
Machine learning.
Description
Physical Description:ix, 343 p. illus. 26 cm.
Bibliography:Includes bibliographical references.
ISBN:0306305461

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