Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 /

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Bibliographische Detailangaben
Körperschaften: Spreading Resistance Symposium, Gaithersburg, Md, American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics, United States. National Bureau of Standards
Weitere Verfasser: Ehrstein, James R.
Format: Tagungsbericht Buch
Sprache:English
Veröffentlicht: Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974.
Schriftenreihe:Semiconductor measurement technology
NBS special publication ; 400-10.
Schlagworte:
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050 0 0 |a QC100  |b .U57 no. 400-10  |a TK7871.85 
111 2 0 |a Spreading Resistance Symposium,  |c Gaithersburg, Md.,  |d 1974. 
245 1 0 |a Spreading Resistance Symposium :  |b proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 /  |c James R. Ehrstein, editor. 
260 |a Washington :  |b U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,  |c 1974. 
300 |a ix, 281 p. :  |b ill. ;  |c 27 cm. 
440 0 |a Semiconductor measurement technology 
490 1 |a NBS special publication ; 400-10 
500 |a "Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards." 
504 |a Bibliography: p. 279-281. 
650 0 |a Semiconductors  |x Testing  |x Congresses. 
650 0 |a Electric resistance, Spreading  |x Congresses. 
700 1 |a Ehrstein, James R. 
710 2 0 |a American Society for Testing and Materials.  |b Committee F-1 on Materials for Electron Devices and Microelectronics. 
710 1 0 |a United States.  |b National Bureau of Standards 
830 0 |a NBS special publication ;  |v 400-10. 
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