Symposium on microscopy : presented at the sixty-second annual meeting, American Society for Testing Materials.

Symposium on microscopy : presented at the sixty-second annual meeting, American Society for Testing Materials.

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Bibliografische gegevens
Coauteurs: Symposium on microscopy Atlantic City, N.J., American Society for Testing Materials. Committee E-1 on Methods and Testing
Formaat: Conferentie akten Boek
Taal:English
Gepubliceerd in: Philadelphia, Pa. : American Society for Testing Materials, 1959.
Reeks:ASTM special technical publication ; 257
Onderwerpen:
Materials > Testing.
Microscopy.
Omschrijving
Fysieke beschrijving:170 p., [1] leaf of plates : ill. ; 24 cm.
Bibliografie:Includes bibliographical references.

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