Symposium on microscopy : presented at the sixty-second annual meeting, American Society for Testing Materials.
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| Corporate Authors: | , |
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Philadelphia, Pa. :
American Society for Testing Materials,
1959.
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| Series: | ASTM special technical publication ;
257 |
| Subjects: |
| Physical Description: | 170 p., [1] leaf of plates : ill. ; 24 cm. |
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| Bibliography: | Includes bibliographical references. |