Society of Photo-optical Instrumentation Engineers (U.S.), Metallurgical Society (U.S.), Glembocki, O. J., Pollak, F. H., & Song, J. J. (1987). Modern optical characterization techniques for semiconductors and semiconductor devices. SPIE--the International Society for Optical Engineering.
Chicago Style (17. basım) AtıfSociety of Photo-optical Instrumentation Engineers (U.S.), Metallurgical Society (U.S.), O. J. Glembocki, Fred H. Pollak, ve J. J. Song. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1987.
MLA (8th ed.) AtıfSociety of Photo-optical Instrumentation Engineers (U.S.), et al. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE--the International Society for Optical Engineering, 1987.