http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Modern optical characterization techniques for semiconductors and semiconductor devices
Society of Photo-optical Instrumentation Engineers (U.S.)
SPIE--the International Society for Optical Engineering
O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 794