Modern optical characterization techniques for semiconductors and semiconductor devices /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Awduron Corfforaethol: Society of Photo-optical Instrumentation Engineers (U.S.), Metallurgical Society (U.S.)
Awduron Eraill: Glembocki, O. J., Pollak, Fred H., Song, J. J.
Fformat: Llyfr
Iaith:English
Cyhoeddwyd: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
Cyfres:Proceedings of SPIE--the International Society for Optical Engineering ; v. 794
Pynciau:

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Rhif Galw: A3:AB09C3 D01846
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