Modern optical characterization techniques for semiconductors and semiconductor devices /

Modern optical characterization techniques for semiconductors and semiconductor devices /

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Bibliografiske detaljer
Corporate Authors: Society of Photo-optical Instrumentation Engineers (U.S.), Metallurgical Society (U.S.)
Andre forfattere: Glembocki, O. J., Pollak, Fred H., Song, J. J.
Format: Bog
Sprog:English
Udgivet: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
Serier:Proceedings of SPIE--the International Society for Optical Engineering ; v. 794
Fag:
Thin film devices > Congresses.
Thin films > Optical properties > Congresses.

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