Proceedings : 1975 annual Reliability and Maintainability Symposium, Washington, D.C. 28-30 January 1975.
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| Corporate Authors: | , |
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
New York, N.Y. :
Institute of Electrical and Electronics Engineers,
c1975.
|
| Series: | Annals of assurance sciences ;
1975. |
| Subjects: |
| Item Description: | Cover title. Includes index. IEEE catalog no. 73CHO918-3 RQC |
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| Physical Description: | xii, 606, xxiv p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographical references. |