Neural models and algorithms for digital testing /
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| Main Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic Publishers,
c1991.
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| Series: | Kluwer international series in engineering and computer science ;
SECS 140. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing |
| Subjects: |
| Physical Description: | xii, 184 p. : ill. ; 25 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0792391659 (acid-free paper) |