Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 /

Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 /

Gespeichert in:
Bibliographische Detailangaben
Körperschaft: Materials Research Symposium National Bureau of Standards
Weitere Verfasser: LaFleur, Philip D.
Format: Regierungsdokument Tagungsbericht Buch
Sprache:English
Veröffentlicht: Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976-
Schriftenreihe:NBS special publication ; 422
Schlagworte:
Trace analysis > Congresses.
Chemistry, Analytical > Congresses.
Trace elements > Congresses.
Beschreibung
Beschreibung:v. : ill. ; 24 cm.
Bibliographie:Includes bibliographical references.

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