Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 /

Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 /

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Bibliographic Details
Corporate Author: Materials Research Symposium National Bureau of Standards
Other Authors: LaFleur, Philip D.
Format: Government Document Conference Proceeding Book
Language:English
Published: Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976-
Series:NBS special publication ; 422
Subjects:
Trace analysis > Congresses.
Chemistry, Analytical > Congresses.
Trace elements > Congresses.
Description
Physical Description:v. : ill. ; 24 cm.
Bibliography:Includes bibliographical references.

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