Advances in x-ray analysis : proceedings of the ... annual Conference on Application of X-ray Analysis /

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Bibliographic Details
Corporate Authors: Conference on Application of X-ray Analysis, Denver Research Institute
Format: Conference Proceeding
Language:English
Published: New York : Plenum Press, 1960-
Subjects:
Description
Published:Vol. 1 (Aug. 7-9, 1957)-
Ceased with v. 39 (1995).
Item Description:Vol. 1-<25> includes 6th-<30th> proceedings of the annual conference.
Physical Description:39 v. : ill. ; 26 cm.
Publication Frequency:Annual
ISSN:0376-0308
1097-0002