Electron beam interactions with solids for microscopy, microanalysis & microlithography : proceedings of the 1st Pfefferkorn Conference, held April 18 to 23, 1982, at the Asilomar Conference Center, Monterey, CA /
Saved in:
Corporate Author: | |
---|---|
Other Authors: | |
Format: | Conference Proceeding Book |
Language: | English |
Published: |
AMF O'Hare [Chicago], IL :
Scanning Electron Microscopy, Inc.,
c1984.
|
Subjects: |
Physical Description: | xii, 372 p. : ill. ; 29 cm. |
---|---|
Bibliography: | Includes bibliographies and indexes. |
ISBN: | 0931288304 |