IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.

IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.

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Bibliographic Details
Corporate Authors: IEEE Electron Devices Society, IEEE Reliability Society, Institute of Electrical and Electronics Engineers (U.S.)
Format: Journal
Language:English
Published: New York, NY : Institute of Electrical and Electronics Engineers, c2001-
Subjects:
Electronic industries > Quality control > Periodicals.
Electronic apparatus and appliances > Reliability > Periodicals.
Online Access:http://ieeexplore.ieee.org/lpdocs/epic03/RecentIssues.htm?punumber=7298
http://ieeexplore.ieee.org/servlet/opac?punumber=7298
Description
Published:Vol. 1, no. 1 (Mar. 2001)-
Item Description:Title from cover.
Physical Description:v.
Also available to subscribers via the World Wide Web.
Publication Frequency:Quarterly.
ISSN:1530-4388

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