Thermal resistance measurements /

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Bibliographic Details
Main Author: Oettinger, Frank F.
Other Authors: Blackburn, David L.
Format: Book
Language:English
Published: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1990.
Series:Semiconductor measurement technology.
NIST special publication ; 400-86.
Subjects:
Description
Item Description:"July 1990."
Physical Description:v, 72 p. : ill. ; 28 cm.
Bibliography:Includes bibliographical references (p. 68-72).