Applications of electron microfractography to materials research.

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Detalles Bibliográficos
Corporate Authors: Symposium on Applications of Electron Microfractography to Materials Research Toronto, Ont., American Society for Testing and Materials. Subcommittee II on Fractography
Formato: Conference Proceeding Libro
Idioma:English
Publicado: Philadelphia, : American Society for Testing and Materials [1971]
Series:ASTM special technical publication 493.
Subjects:
Descripción
descrición da copia:"Presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."
Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals.
Descrición Física:96 p. : illus. ; 23 cm.
Bibliografía:Includes bibliographical references.