Applications of electron microfractography to materials research.

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Bibliographic Details
Corporate Authors: Symposium on Applications of Electron Microfractography to Materials Research Toronto, Ont., American Society for Testing and Materials. Subcommittee II on Fractography
Format: Conference Proceeding Book
Language:English
Published: Philadelphia, : American Society for Testing and Materials [1971]
Series:ASTM special technical publication 493.
Subjects:
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111 2 |a Symposium on Applications of Electron Microfractography to Materials Research  |d (1970 :  |c Toronto, Ont.) 
245 1 0 |a Applications of electron microfractography to materials research. 
260 |a Philadelphia, :  |b American Society for Testing and Materials  |c [1971] 
300 |a 96 p. :  |b illus. ;  |c 23 cm. 
490 0 |a ASTM special technical publication 493. 
500 |a "Presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970." 
500 |a Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals. 
504 |a Includes bibliographical references. 
650 0 |a Fractography  |x Congresses. 
650 0 |a Electron microscopy  |x Congresses. 
710 2 |a American Society for Testing and Materials.  |b Subcommittee II on Fractography. 
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