Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials.

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Bibliographic Details
Corporate Authors: Symposium on Electron Microfractography (San Francisco), American Society for Testing and Materials. Subcommittee II on Fractography
Format: Conference Proceeding Book
Language:English
Published: Philadelphia, : American Society for Testing and Materials [1969]
Series:ASTM special technical publication ; 453.
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Description
Item Description:"Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals."
Physical Description:v, 235 p. : illus. ; 24 cm.
Bibliography:Includes bibliographies.
ISBN:0803100132