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01048cam a2200277 a 4500 |
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c000216071 |
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CARM |
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20060725115905.0 |
| 008 |
801003s1981 nyu b 001 0 eng |
| 010 |
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|a 80025156
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| 019 |
1 |
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|5 LACONCORD2021
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|a (OCoLC)6889202
|5 LACONCORD2021
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|a LC
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|c LC
|d LC
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|a TK7871.99.M44
|b D38
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| 082 |
0 |
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|a 621.3815/2
|2 19
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| 100 |
1 |
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|a Davis, J. R.
|q (John Richard),
|d 1951-
|
| 245 |
1 |
0 |
|a Instabilities in MOS devices /
|c J. R. Davis.
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| 260 |
|
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|a New York :
|b Gordon and Breach Science Publishers,
|c c1981.
|
| 300 |
|
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|a xv, 175 p. :
|b 24 cm.
|
| 440 |
|
0 |
|a Electrocomponent science monographs ;
|v v. 12
|
| 504 |
|
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|a Includes bibliographical refererences (p. 151-175) and index.
|
| 650 |
|
0 |
|a Metal oxide semiconductors.
|
| 852 |
8 |
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|b CARM
|h A2:AN37A0
|i B06298
|p 0312949
|f BK
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|p Can circulate
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|e B06298
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