rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Tests
    sub title: a comprehensive reference for assessments in psychology, education, and business
  name:
    name part: Sweetland, Richard C.
    name part: 1931-
  name:
    name part: Keyser, Daniel J.
    name part: 1935-
  type of resource: text
  origin info:
    place:
      place term: mou
    place:
      place term: Kansas City
    publisher: Test Corp. of America
    date issued: 1983
    edition: Library ed., 1st ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: lxxii, 890 p. ; 24 cm.
  table of contents: Includes indexes.
  note: Richard C. Sweetland, Daniel J. Keyser, editors ; William A. O'Connor, associate editor ; Sam Pirnazar, contributing consultant.
  note: Includes indexes.
  subject:
    topic: Psychological tests
  subject:
    topic: Educational tests and measurements
  subject:
    topic: Occupational aptitude tests
  classification: BF176 .T43 1983
  classification: BF176 .T4 1983
  classification: 153.9/3
  classification: 153.9/028/7
  identifier: 0961128607 :
  identifier: 0961128615 (lib. bdg.) :
  identifier: 83005074
  location:
    physical location: CARM
  record info:
    record content source: LC
    record creation date: 830602
    record change date: 20000928203040.0
    record identifier: c000217529
    language of cataloging:
      language term: eng