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| LEADER |
01311cam a2200301 a 4500 |
| 001 |
c000223553 |
| 003 |
CARM |
| 005 |
20060908093450.0 |
| 008 |
810319s1980 paua b 100 0 eng |
| 010 |
|
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|a 79057525
|
| 019 |
1 |
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|a 1970063
|5 LACONCORD2021
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| 035 |
|
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|a (OCoLC)6806575
|5 LACONCORD2021
|
| 040 |
|
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|a LC
|b eng
|c LC
|d NUN
|
| 050 |
0 |
0 |
|a QC611.8.S5
|b L53
|
| 082 |
0 |
4 |
|a 621.3815/2/028
|2 19
|
| 245 |
0 |
0 |
|a Lifetime factors in silicon :
|b a symposium /
|c sponsored by ASTM Committee F-1 on Electronics, American Society for Testing and Materials, San Diego, Calif., 15-16 Feb., 1979 ; R.D. Westbrook, symposium chairman.
|
| 260 |
|
|
|a Philadelphia, Pa. :
|b The Society,
|c c1980.
|
| 300 |
|
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|a 250 p. :
|b ill. ;
|c 24 cm.
|
| 440 |
|
0 |
|a ASTM special technical publication ;
|v 712
|
| 500 |
|
|
|a "04-712000-46."
|
| 504 |
|
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|a Includes bibliographical references.
|
| 650 |
|
0 |
|a Silicon
|x Electric properties
|v Congresses.
|
| 650 |
|
0 |
|a Semiconductors
|v Congresses.
|
| 700 |
1 |
|
|a Westbrook, R. D.
|
| 710 |
2 |
|
|a American Society for Testing and Materials.
|b Committee F-1 on Electronics.
|
| 852 |
8 |
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|b CARM
|h A2:AO26A0
|i B06471
|p 0313360
|f BK
|
| 999 |
f |
f |
|i 913ed224-3394-5848-a125-417f7d3a6554
|s dd830a2f-261d-5734-b9f9-028b06623612
|
| 952 |
f |
f |
|p Can circulate
|a CAVAL
|b CAVAL
|c CAVAL
|d CARM 1 Store
|e B06471
|f A2:AO26A0
|h Other scheme
|i book
|m 0313360
|