Testing and diagnosis of analog circuits and systems /

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Bibliographic Details
Other Authors: Liu, Ruey-Wen
Format: Book
Language:English
Published: New York, N.Y. : Van Nostrand Reinhold, c1991.
Subjects:
Description
Physical Description:xiv, 284 p. : ill. ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0442259328