Fatigue of electronic materials /

Αποθηκεύτηκε σε:
Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: ASTM Committee E-8 on Fatigue and Fracture
Άλλοι συγγραφείς: Mitchell, M. R. (Michael R.), 1941-, Schroeder, Scott A.
Μορφή: Βιβλίο
Γλώσσα:English
Έκδοση: Philadelphia, PA : ASTM, c1994.
Σειρά:ASTM special technical publication ; 1153.
Θέματα:
Πίνακας περιεχομένων:
  • Creep-Fatigue Damage Analysis of Solder Joints / S. H. Ju, S. Kuskowski, B. I. Sandor and M. E. Plesha
  • Creep-Fatigue Interactions in Eutectic Tin-Lead Solder Alloys / Chih-Wei Kuo, Shankar M. L. Sastry and Kenneth L. Jerina
  • A Unified Creep-Plasticity Theory for Solder Alloys / David L. McDowell, Matthew P. Miller and Del C. Brooks
  • Thermomechanical and Fatigue Behavior of High-Temperature Lead and Lead-Free Solder Joints / Y.-H. Pao, S. Badgley, R. Govila and E. Jih
  • A Model for Primary Creep of 63Sn-37Pb Solder / S. A. Schroeder, W. L. Morris, M. R. Mitchell and M. R. James
  • Test Methodologies to Perform Valid Accelerated Thermomechanical Fatigue Tests of Solder Joints / Darrel R. Frear, N. Robert Sorensen and John S. Martens
  • High-Cycle Fatigue of Kovar / James A. Wasynczuk, W. Dave Hanna, Franklin D. Ross and Thomas A. Freitag
  • Thermal Stresses in Cooled Heat-Releasing Elements of Electronic Devices / Anatoliy Parnas.
  • Stress and Thermal Analysis of Resistance Temperature Detectors / Dale A. Wilson and Anbazhagan Katherisan.