Ehrstein, J. R., & Croarkin, M. C. (1999). The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements (1999 edition.). U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.
Style de citation Chicago (17e éd.)Ehrstein, James R., et M. C. Croarkin. The Certification of 100 Mm Diameter Silicon Resistivity SRMs 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements. 1999 edition. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.
Style de citation MLA (8e éd.)Ehrstein, James R., et M. C. Croarkin. The Certification of 100 Mm Diameter Silicon Resistivity SRMs 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements. 1999 edition. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.