IEEE international reliability physics proceedings /

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Bibliographic Details
New Title:	International Reliability Physics Symposium. IEEE International Reliability Physics Symposium proceedings
Previous Title:	International Reliability Physics Symposium. Reliability physics
Corporate Authors:	IEEE Electron Devices Society, IEEE Reliability Society, International Reliability Physics Symposium
Format:	Conference Proceeding
Language:	English
Published:	Piscataway, N.J. : The Societies, c1994-c1996.
Subjects:	Electronic apparatus and appliances > Reliability > Congresses. Electronic apparatus and appliances > Testing > Congresses. Integrated circuits > Reliability > Congresses. Integrated circuits > Testing > Congresses.
Online Access:	Click on "Conference proceedings", then search: Reliability Physics Symposium Search: Reliability Physics Symposium Search: Reliability Physics Symposium

Description
Published:	32nd (Apr. 12, 13, 14, 1994)-34th (Apr. 30, May 1, 2, 1996).
Physical Description:	3 v. : ill. ; 28 cm. Also available by subscription, in PDF format, via the World Wide Web.
Publication Frequency:	Annual
ISSN:	1082-7285 0735-0791

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