National Institute of Standards and Technology (U.S.) & Seiler, D. G. (1994). Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O..
Chicago Style (17th ed.) CitationNational Institute of Standards and Technology (U.S.) and David G. Seiler. Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes, and Devices Used on the GOES and TIROS Satellites. Gaithersburg, MD : Washington, DC: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
MLA (8th ed.) CitationNational Institute of Standards and Technology (U.S.) and David G. Seiler. Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes, and Devices Used on the GOES and TIROS Satellites. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.