Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /

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Bibliografski detalji
Autor kompanije: National Institute of Standards and Technology (U.S.)
Daljnji autori: Seiler, David G.
Format: Knjiga
Jezik:English
Izdano: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Serija:Semiconductor measurement technology
NIST special publication ; 400-94
Teme:
Opis
Opis djela:"April 1994."
Opis:1 v. (various pagings) : ill. ; 28 cm.
Bibliografija:Includes bibliographical references.