Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /
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| Autor kompanije: | |
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| Daljnji autori: | |
| Format: | Knjiga |
| Jezik: | English |
| Izdano: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1994.
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| Serija: | Semiconductor measurement technology
NIST special publication ; 400-94 |
| Teme: |
| Opis djela: | "April 1994." |
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| Opis: | 1 v. (various pagings) : ill. ; 28 cm. |
| Bibliografija: | Includes bibliographical references. |