Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /

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Соавтор: National Institute of Standards and Technology (U.S.)
Другие авторы: Seiler, David G.
Формат:
Язык:English
Опубликовано: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Серии:Semiconductor measurement technology
NIST special publication ; 400-94
Предметы:
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245 0 0 |a Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /  |c David G. Seiler ... [et al.]. 
260 |a Gaithersburg, MD :  |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;  |a Washington, DC :  |b For sale by the Supt. of Docs., U.S. G.P.O.,  |c 1994. 
300 |a 1 v. (various pagings) :  |b ill. ;  |c 28 cm. 
440 0 |a Semiconductor measurement technology 
440 0 |a NIST special publication ;  |v 400-94 
500 |a "April 1994." 
504 |a Includes bibliographical references. 
610 2 0 |a GOES (Meteorological satellite) 
610 2 0 |a TIROS satellites. 
650 0 |a Space vehicles  |x Optical equipment. 
650 0 |a Infrared detectors. 
700 1 |a Seiler, David G. 
710 2 |a National Institute of Standards and Technology (U.S.) 
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