Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /
Na minha lista:
| Autor Corporativo: | |
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| Outros Autores: | |
| Formato: | Livro |
| Idioma: | English |
| Publicado em: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1994.
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| Colecção: | Semiconductor measurement technology
NIST special publication ; 400-94 |
| Assuntos: |
CARM 1 Store
| Área/Cota: |
A1:AP30C0 F02083 |
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| Cód. Barras: 1 | Disponível Localização |