Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /

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Detalhes bibliográficos
Autor Corporativo: National Institute of Standards and Technology (U.S.)
Outros Autores: Seiler, David G.
Formato: Livro
Idioma:English
Publicado em: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Colecção:Semiconductor measurement technology
NIST special publication ; 400-94
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