Micromachined devices and components : 23-24 October, 1995, Austin, Texas /

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Detalles Bibliográficos
Corporate Authors: National Institute of Standards and Technology (U.S.), Society of Photo-optical Instrumentation Engineers, Semiconductor Equipment and Materials International
Outros autores: Chau, Kevin, Roop, Ray
Formato: Libro
Idioma:English
Publicado: Bellingham, Wash. : SPIE, c1995.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2642.
Subjects:
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050 0 0 |a TJ163  |b .M49 1995 
082 0 0 |a 621.3815/2  |2 21 
245 0 0 |a Micromachined devices and components :  |b 23-24 October, 1995, Austin, Texas /  |c Ray Roop, Kevin Chau, chairs/editors ; sponsored by SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology, SPIE--the International Society for Optical Engineering. 
260 |a Bellingham, Wash. :  |b SPIE,  |c c1995. 
300 |a ix, 296 p. :  |b ill. ;  |c 28 cm. 
490 1 |a Proceedings / SPIE--the International Society for Optical Engineering ;  |v v. 2642 
504 |a Includes bibliographic references and index. 
650 0 |a Microelectromechanical systems  |x Congresses. 
650 0 |a Micromachining  |x Congresses. 
700 1 |a Chau, Kevin. 
700 1 |a Roop, Ray. 
710 2 |a National Institute of Standards and Technology (U.S.) 
710 2 |a Society of Photo-optical Instrumentation Engineers. 
710 2 |a Semiconductor Equipment and Materials International 
830 0 |a Proceedings of SPIE--the International Society for Optical Engineering ;  |v v. 2642. 
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