Fundamentals of surface and thin film analysis /
Guardado en:
| Autor principal: | |
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| Otros Autores: | |
| Formato: | Libro |
| Lenguaje: | English |
| Publicado: |
New York :
North-Holland,
c1986.
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| Materias: |
| Notas: | Includes bibliographical references and index. |
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| Descripción Física: | xviii, 352, [2] p. : ill. ; 24 cm. |
| Bibliografía: | Includes bibliographies and index. |
| ISBN: | 0444009892 |