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| LEADER |
01108cam a2200289 a 4500 |
| 001 |
c000284762 |
| 003 |
CARM |
| 005 |
20080717134809.0 |
| 008 |
960219s1986 nyua b 001 0 eng d |
| 010 |
|
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|a 86002479
|
| 019 |
1 |
|
|a 4395092
|z 21965854
|z 47902987
|5 LACONCORD2021
|
| 020 |
|
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|a 0444009892
|
| 035 |
|
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|a (OCoLC)13214540
|5 LACONCORD2021
|
| 040 |
|
|
|a NS:APY
|b eng
|d ANU
|c VCAV
|
| 082 |
0 |
4 |
|a 530.41
|
| 100 |
1 |
|
|a Feldman, Leonard C.
|
| 245 |
1 |
0 |
|a Fundamentals of surface and thin film analysis /
|c Leonard C. Feldman, James W. Mayer.
|
| 260 |
|
|
|a New York :
|b North-Holland,
|c c1986.
|
| 300 |
|
|
|a xviii, 352, [2] p. :
|b ill. ;
|c 24 cm.
|
| 500 |
|
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|a Includes bibliographical references and index.
|
| 504 |
|
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|a Includes bibliographies and index.
|
| 650 |
|
0 |
|a Surfaces (Technology)
|x Analysis.
|
| 650 |
|
0 |
|a Thin films
|x Analysis.
|
| 700 |
1 |
|
|a Mayer, James W.,
|d 1930-
|
| 852 |
8 |
|
|b CARM
|h A3:AR09B0
|i B10770
|p 0492581
|f BK
|
| 999 |
f |
f |
|i 0e1d8f2d-c16a-5e41-9d65-2d406a97ed4d
|s 00d56b83-ea92-56c4-8666-8c6608cea841
|
| 952 |
f |
f |
|p Can circulate
|a CAVAL
|b CAVAL
|c CAVAL
|d CARM 1 Store
|e B10770
|f A3:AR09B0
|h Other scheme
|i book
|m 0492581
|