Pattern recognition and artificial intelligence : towards an integration : proceedings of an international workshop held in Amsterdam, May 18-20, 1988 /

Gardado en:
Detalles Bibliográficos
Outros autores: Kanal, Laveen N., Gelsema, Edzard S., 1937-
Formato: Libro
Idioma:English
Publicado: Amsterdam ; New York : New York, N.Y. : North Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1988.
Series:Machine intelligence and pattern recognition ; v. 7
Subjects:
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245 0 0 |a Pattern recognition and artificial intelligence :  |b towards an integration : proceedings of an international workshop held in Amsterdam, May 18-20, 1988 /  |c edited by Edzard S. Gelsema and Laveen N. Kanal. 
260 |a Amsterdam ;  |a New York :  |b North Holland ;  |a New York, N.Y. :  |b Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.,  |c 1988. 
300 |a xv, 499 p. :  |b ill. ;  |c 23 cm. 
440 0 |a Machine intelligence and pattern recognition ;  |v v. 7 
504 |a Includes bibliographies and indexes. 
650 0 |a Pattern perception. 
650 0 |a Artificial intelligence. 
650 0 |a Image processing. 
700 1 |a Kanal, Laveen N. 
700 1 |a Gelsema, Edzard S.,  |d 1937- 
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