Design and testing guides for the CMOS and lateral bipolar-on-SOI test library /

Design and testing guides for the CMOS and lateral bipolar-on-SOI test library /

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Bibliographic Details
Main Author: Marshall, J. C. (Janet C.)
Other Authors: Zaghloul, M. E. (Mona Elwakkad)
Format: Book
Language:English
Published: Gaithersburg, Md. : Washington, D.C. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Series:Semiconductor measurement technology
NIST special publication ; 400-93
Subjects:
Integrated circuits > Very large scale integration > Computer-aided design.
Metal oxide semiconductors > Testing.
Silicon-on-insulator technology.
Description
Item Description:"Issued September 1994."
Physical Description:vi, 132 p. : ill. ; 28 cm.
Bibliography:Includes bibliographical references (p. 17-18)

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