Design and testing guides for the CMOS and lateral bipolar-on-SOI test library /

Design and testing guides for the CMOS and lateral bipolar-on-SOI test library /

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Bibliographic Details
Main Author: Marshall, J. C. (Janet C.)
Other Authors: Zaghloul, M. E. (Mona Elwakkad)
Format: Book
Language:English
Published: Gaithersburg, Md. : Washington, D.C. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Series:Semiconductor measurement technology
NIST special publication ; 400-93
Subjects:
Integrated circuits > Very large scale integration > Computer-aided design.
Metal oxide semiconductors > Testing.
Silicon-on-insulator technology.
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100 1 |a Marshall, J. C.  |q (Janet C.) 
245 1 0 |a Design and testing guides for the CMOS and lateral bipolar-on-SOI test library /  |c Janet C. Marshall and Mona E. Zaghloul. 
260 |a Gaithersburg, Md. :  |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;  |a Washington, D.C. :  |b For sale by the Supt. of Docs., U.S. G.P.O.,  |c 1994. 
300 |a vi, 132 p. :  |b ill. ;  |c 28 cm. 
490 1 0 |a Semiconductor measurement technology 
490 1 0 |a NIST special publication ;  |v 400-93 
500 |a "Issued September 1994." 
504 |a Includes bibliographical references (p. 17-18) 
650 0 |a Integrated circuits  |x Very large scale integration  |x Computer-aided design. 
650 0 |a Metal oxide semiconductors  |x Testing. 
650 0 |a Silicon-on-insulator technology. 
700 1 |a Zaghloul, M. E.  |q (Mona Elwakkad) 
830 0 |a Semiconductor measurement technology 
830 0 |a NIST special publication ;  |v 400-93 
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