Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Awdur Corfforaethol: Society of Photo-optical Instrumentation Engineers
Awduron Eraill: Chen, Ray T., Lowell, John, Mathur, Jagdish P.
Fformat: Llyfr
Iaith:English
Cyhoeddwyd: Bellingham, Wash. : SPIE, 1996.
Cyfres:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2877.
Pynciau:
Disgrifiad
Disgrifiad Corfforoll:ix, 218 p. : ill. ; 28 cm.
Llyfryddiaeth:Includes bibliographical references and index.
ISBN:0819422754