Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas /

Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas /

Uloženo v:
Podrobná bibliografie
Korporativní autor: Society of Photo-optical Instrumentation Engineers
Další autoři: Chen, Ray T., Lowell, John, Mathur, Jagdish P.
Médium: Kniha
Jazyk:English
Vydáno: Bellingham, Wash. : SPIE, 1996.
Edice:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2877.
Témata:
Integrated circuits industry > Congresses.
Manufacturing processes > Congresses.
Semiconductors > Design and construction > Congresses.
Integrated circuits > Design and construction > Congresses.
Semiconductors > Testing > Optical methods > Congresses.
Optical detectors > Congresses.

CARM 1 Store

Informace o exemplářích z: CARM 1 Store
Signatura: A3:AE31C0 F06472
Jednotka 1 Dostupné  Požadavek

Podobné jednotky