Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas /

Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas /

Na minha lista:
Detalhes bibliográficos
Autor Corporativo: Society of Photo-optical Instrumentation Engineers
Outros Autores: Chen, Ray T., Lowell, John, Mathur, Jagdish P.
Formato: Livro
Idioma:English
Publicado em: Bellingham, Wash. : SPIE, 1996.
coleção:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2877.
Assuntos:
Integrated circuits industry > Congresses.
Manufacturing processes > Congresses.
Semiconductors > Design and construction > Congresses.
Integrated circuits > Design and construction > Congresses.
Semiconductors > Testing > Optical methods > Congresses.
Optical detectors > Congresses.

CARM 1 Store

Detalhes do Exemplar CARM 1 Store
Área/Cota: A3:AE31C0 F06472
Cópia 1 Disponível  Localização

Registros relacionados