INSTANT - IGBT network simulation and transient analysis tool /

INSTANT - IGBT network simulation and transient analysis tool /

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Détails bibliographiques
Auteur principal: Hefner, A. R.
Collectivités auteurs: National Institute of Standards and Technology (U.S.), United States. Dept. of Commerce. Technology Administration
Format: Livre
Langue:English
Publié: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration : National Institute of Standards and Technology, 1992.
Collection:Semiconductor measurement technology
NIST special publication ; 400-88
Sujets:
Metal oxide semiconductor field-effect transistors.
Bipolar transistors > Data processing.

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