Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Сохранить в:
Библиографические подробности
Главный автор: Albers, John
Соавтор: National Institute of Standards and Technology (U.S.)
Формат: ‌
Язык:English
Опубликовано: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Серии:Semiconductor measurement technology
NIST special publication ; 400-89
Предметы:
Semiconductors > Thermal properties.
Thermal analysis > Computer programs.
Fourier analysis > Data processing.
Описание
Примечание:"June 1992."
Объем:iii, 29 p. ; 28 cm.
Библиография:Includes bibliographical references (p. 18)

Схожие документы