Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Saved in:

Bibliografiske detaljer
Hovedforfatter:	Albers, John
Institution som forfatter:	National Institute of Standards and Technology (U.S.)
Format:	Bog
Sprog:	English
Udgivet:	Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Serier:	Semiconductor measurement technology NIST special publication ; 400-89
Fag:	Semiconductors > Thermal properties. Thermal analysis > Computer programs. Fourier analysis > Data processing.

Beskrivelse
Emne beskrivelse:	"June 1992."
Fysisk beskrivelse:	iii, 29 p. ; 28 cm.
Bibliografi:	Includes bibliographical references (p. 18)

Lignende værker