Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

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Bibliografske podrobnosti
Glavni avtor: Albers, John
Korporativna značnica: National Institute of Standards and Technology (U.S.)
Format: Knjiga
Jezik:English
Izdano: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Serija:Semiconductor measurement technology
NIST special publication ; 400-89
Teme:
Semiconductors > Thermal properties.
Thermal analysis > Computer programs.
Fourier analysis > Data processing.
Opis
Opis knjige/članka:"June 1992."
Fizični opis:iii, 29 p. ; 28 cm.
Bibliografija:Includes bibliographical references (p. 18)

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