LEADER 01563cam a2200373 a 4500
001 c000292241
003 CARM
005 20090525081223.0
008 940419s1992 mdu b f000 0 eng d
010 |a 95117733 
019 1 |a 10857526  |5 LACONCORD2021 
035 |a (OCoLC)26341260  |5 LACONCORD2021 
040 |a LC  |b eng  |c LC  |d LC 
042 |a lccopycat 
050 0 |a QC100  |b .U57 no. 400-89  |a TK7871.85 
082 0 0 |a 621.3815  |2 20 
100 1 |a Albers, John. 
245 1 0 |a Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /  |c John Albers. 
246 3 0 |a TXYZ20 
260 |a Gaithersburg, MD :  |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;  |a Washington, DC :  |b For sale by the Supt. of Docs., U.S. G.P.O.,  |c 1992. 
300 |a iii, 29 p. ;  |c 28 cm. 
490 1 |a Semiconductor measurement technology 
490 1 |a NIST special publication ;  |v 400-89 
500 |a "June 1992." 
504 |a Includes bibliographical references (p. 18) 
650 0 |a Semiconductors  |x Thermal properties. 
650 0 |a Thermal analysis  |x Computer programs. 
650 0 |a Fourier analysis  |x Data processing. 
710 2 |a National Institute of Standards and Technology (U.S.) 
830 0 |a Semiconductor measurement technology 
830 0 |a NIST special publication ;  |v 400-89 
852 8 |b CARM  |h A3:AE31C0  |i F06472  |p 0516592  |f BK 
999 f f |i b8e46e82-96b2-5242-babb-a03a4c1818f6  |s b3e2d276-483b-50c6-9ab2-7e09b6887ed9 
952 f f |p Can circulate  |a CAVAL  |b CAVAL  |c CAVAL  |d CARM 1 Store  |e F06472  |f A3:AE31C0  |h Other scheme  |i book  |m 0516592