Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

Saved in:
Bibliografiske detaljer
Hovedforfatter: Albers, John
Institution som forfatter: National Institute of Standards and Technology (U.S.)
Format: Bog
Sprog:English
Udgivet: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Serier:Semiconductor measurement technology
NIST special publication ; 400-89
Fag:
Semiconductors > Thermal properties.
Thermal analysis > Computer programs.
Fourier analysis > Data processing.

CARM 1 Store

Detaljer om beholdninger fra CARM 1 Store
Klassifikationsnummer: A3:AE31C0 F06472
Kopi 1 Tilgængelig  Reservér”

Lignende værker