Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /
Gespeichert in:
| 1. Verfasser: | |
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| Körperschaft: | |
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1992.
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| Schriftenreihe: | Semiconductor measurement technology
NIST special publication ; 400-89 |
| Schlagworte: |
CARM 1 Store
| Signatur: |
A3:AE31C0 F06472 |
|---|---|
| Exemplar 1 | Verfügbar Bestellen |