Marshall, J. C., & Mattis, R. L. (1992). Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O..
Chicago-Zitierstil (17. Ausg.)Marshall, J. C., und Richard L. Mattis. Evaluating a Chip, Wafer, or Lot Using SUXES, SPICE, and STAT2. Gaithersburg, MD : Washington, DC: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
MLA-Zitierstil (8. Ausg.)Marshall, J. C., und Richard L. Mattis. Evaluating a Chip, Wafer, or Lot Using SUXES, SPICE, and STAT2. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.