Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 /

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书目详细资料
主要作者:	Marshall, J. C. (Janet C.)
企业作者:	National Institute of Standards and Technology (U.S.)
其他作者:	Mattis, Richard L.
格式:	图书
语言:	English
出版:	Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
丛编:	Semiconductor measurement technology NIST special publication ; 400-90
主题:	SPICE (Computer file) Metal oxide semiconductors, Complementary > Computer simulation.

实物特征
Item Description:	"April 1992."
实物描述:	iv, 140 p. : ill. ; 28 cm.
参考书目:	Includes bibliographical references (p. 41-42)

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