Semiconductor measurement technology : thin film reference materials development final report for CRADA CN-1364 /
Kaydedildi:
| Materyal Türü: | Kitap |
|---|---|
| Dil: | Undetermined |
| Baskı/Yayın Bilgisi: |
Gaithersburg, MD :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
1998.
|
| Seri Bilgileri: | 830NIST special publication ;
400-100 |
| Konular: |
| Fiziksel Özellikler: | 38 p. ; 29 cm. |
|---|