Semiconductor measurement technology : thin film reference materials development final report for CRADA CN-1364 /
Shranjeno v:
| Format: | Knjiga |
|---|---|
| Jezik: | Undetermined |
| Izdano: |
Gaithersburg, MD :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
1998.
|
| Serija: | 830NIST special publication ;
400-100 |
| Teme: |
| Fizični opis: | 38 p. ; 29 cm. |
|---|