Interferometry VII--applications : 13-14 July 1995, San Diego, California /
Gardado en:
| Corporate Authors: | , |
|---|---|
| Outros autores: | , , |
| Formato: | Libro |
| Idioma: | English |
| Publicado: |
Bellingham, Wash., USA :
SPIE,
c1995.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2545. |
| Subjects: |
CARM 1 Store
| Número de Clasificación: |
A3:AF28C0 F06842 |
|---|---|
| Copia 1 | Dispoñible Facer reserva |